Structural, Syntactic, and Statistical Pattern Recognition
Structural, Syntactic, and Statistical Pattern Recognition
Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings
Hancock, Edwin R.; Biggio, Battista; Ho, Tin Kam; Bai, Xiao; Wilson, Richard C.; Robles-Kelly, Antonio
Springer International Publishing AG
08/2018
524
Mole
Inglês
9783319977843
15 a 20 dias
819