Metal Impurities in Silicon- and Germanium-Based Technologies

Metal Impurities in Silicon- and Germanium-Based Technologies

Origin, Characterization, Control, and Device Impact

Simoen, Eddy; Claeys, Cor

Springer International Publishing AG

08/2018

438

Dura

Inglês

9783319939247

15 a 20 dias

869


ebook

Descrição não disponível.
Preface.- Introduction.- Basic Properties of Metals in Semiconductors.- Sources of Metals in Si and Ge Processing.- Characterization and Detection of Metals in Silicon and Germanium.- Electrical Activity of Metals in Si and Ge.- Impact of Metals on Silicon Devices and Circuits.- Gettering and Passivation of Metals in Silicon and Germanium.- Modeling and Simulation of Metals in Silicon and Germanium.- Conclusions.
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Metal Gettering;Metal Precipitation and Segregation;Defects and Device Performance;Defect Engineering;Device Yield Improvement;Semiconductor Device Fabrication