Kelvin Probe Force Microscopy

Kelvin Probe Force Microscopy

From Single Charge Detection to Device Characterization

Sadewasser, Sascha; Glatzel, Thilo

Springer International Publishing AG

03/2018

521

Dura

Inglês

9783319756868

15 a 20 dias

980


ebook

Descrição não disponível.
Part I: Technical aspects.- Experimental technique and working modes.- Dissipation KPFM.- KPFM techniques for liquid environment.- Open-loop and excitation KPFM.- Quantitative KPFM on semiconductor devices.- KPFM with atomic resolution.- KPFM with atomic resolution.- Part II: Theoretical Aspects.- Local dipoles in atomic and Kelvin probe force microscopy.- Influence of the tip electrostatic field on high resolution KPFM measurements.- Modelling the electrostatic field of a cantilever.- Theory of open-loop KPFM.- KPFM in a SPM simulator.- Electrostatic interactions with dielectric samples.- Part III: Applications.- Kelvin spectroscopy of single molecules.- KPFM for single molecule chemistry.- Optoelectronic properties of single molecules.- Quantitative KPFM of molecular self-assemblies.- Applications of KPFM in liquids.- KPFM of organic solar cell materials.- Correlation of optical and electrical nanoscale properties of organic devices.- KPFM for catalysis.- Quantitative electrical measurements of SiC devices.
Scanning Kelvin Probe Microscopy;Electrostatic Force Microscopy;KPFM techniques for liquid environment;KPFM with atomic resolution;KPFM with atomic resolution;electrostatic field of a cantilever;Kelvin spectroscopy of single molecules